Web7 apr. 2024 · The TOF-SIMS analysis was performed on a TOF-SIMS V (ION-TOF GmbH, Germany) instrument. Mass spectra acquisition and imaging experiments, presented hereafter, were carried out with a 25 keV pulsed Bi 3+ cluster ion source, delivering a 0.14 pA target current. WebDownload free Adobe Acrobat Reader software for your Windows, Mac OS and Android devices to view, print, and comment on PDF documents. Download de gratis Adobe …
Minerals Free Full-Text Confirmation of Interlayer Sulfidization …
WebIONTOF GmbH is a leading manufacturer of analytical instruments for surface analysis. The company is not only committed to being the most innovative provider of analytical … Web1 apr. 2024 · Request PDF On Apr 1, 2024, A. Tolstoguzov and others published Sputtering of coinage metals with bismuth cluster ions: Experiment and computer simulation Find, read and cite all the research ... dickinson wright reno nv
IONTOF GmbH on LinkedIn: IONTOF download area: global …
Web11 apr. 2024 · 3D-Micromac AG www.3d-micromac.com p. 5 WebIONTOF WebCareer Forum IONTOF - Jobs at TOF-SIMS (time of flight secondary ion mass spectrometry), LEIS (low energy ion scattering), surface spectrometry, surface analysis, … dickinsonwv.com